FREMONT, Calif., Sept. 14, 2022 (GLOBE NEWSWIRE) — Aehr Test Systems (NASDAQ: AEHR), a worldwide supplier of semiconductor production test and reliability qualification equipment, today
announced that President and CEO Gayn Erickson will be a speaker at the EU Power Semiconductor Executive Summit (EU PSES) taking place September 19-20, 2022 at the Hilton Munich Park in
Munich, Germany. Mr. Erickson will be giving a presentation on September 19th at 4:30pm local Munich time.
The presentation is titled, “Evaluating Stabilization of Silicon Carbide MOSFET Gate Threshold Voltage at Wafer Level,” and will discuss how the transition from discrete Silicon Carbide (SiC)
components to multiple SiC die modules or integrated power modules has driven the requirement for known good die (KGD), where the gate threshold voltage stability is critical to the module
reliability…
